Suprasad V. Amari Comment on: a hazard function approximation used in reliability theory. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:2- [Journal]

H. Hirose The trunsored model and its applications to lifetime analysis: unified censored and truncated models. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:11-21 [Journal]

Sangun Park Testing exponentiality based on the Kullback-Leibler information with the type II censored data. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:22-26 [Journal]

A. A. Soliman Estimation of parameters of life from progressively censored data using Burr-XII model. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:34-42 [Journal]

Guangbin Yang Accelerated life tests at higher usage rates. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:53-57 [Journal]

Loon Ching Tang, Kai Xu A multiple objective framework for planning accelerated life tests. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:58-63 [Journal]

A. A. Alhadeed, Shie-Shien Yang Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:64-68 [Journal]

Winfrid G. Schneeweiss Toward a deeper understanding of the availability of series-systems without aging during repairs. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:98-99 [Journal]

Antoine Rauzy A m log m algorithm to compute the most probable configurations of a system with multi-mode independent components. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:156-158 [Journal]

Jian-Ping Li, G. Thompson A method to take account of inhomogeneity in mechanical component reliability calculations. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:159-168 [Journal]

F. K. Hwang A hierarchy of importance indices. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:169-172 [Journal]

K. Jenab, B. S. Dhillon Stochastic fault tree analysis with self-loop basic events. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:173-180 [Journal]

M. V. Frank View through the door of the SOFIA project. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2005, v:54, n:1, pp:181-188 [Journal]

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